Use this url to cite publication: https://cris.mruni.eu/cris/handle/007/37456
The evaluation of efficiency of the built – in test equipment of electronic devices of control systems
Type of publication
Straipsnis konferencijos medžiagoje Web of Science duomenų bazėje / Article in conference proceedings in Web of Science database (P1a1)
Author(s)
Title
The evaluation of efficiency of the built – in test equipment of electronic devices of control systems
Publisher (trusted)
IEEE |
Date Issued
| Date |
|---|
2007 |
Extent
p. 17-21
Is part of
IEEE international Siberian conference on control and communications (SIBCON-2007) : proceedings. Russia, Tomsk, April 20-21, 2007. New York City : IEEE, 2007. ISBN 9781424403462.
Field of Science
Keywords (lt)
Keywords (en)
Abstract (en)
At present, in various control systems the electronic devices with the built-in test equipment are applied. At exploitation of electronic devices, the inspection of their technical state is periodically carried out. For this purpose, the built-in test equipment is applied.At design stages and exploitation of control systems operation safeguarding their reliability are carried out. This requires the information on parameters, which characterize efficiency of use of the built-in test equipment. In the paper, the method of evaluation of definition probability by the built-in test equipment of state of nonserviceability of electronic devices is analyzed.
Type of document
type::text::conference output::conference proceedings::conference paper
ISBN (of the container)
9781424403462
eLABa
2785515
Coverage Spatial
Jungtinės Amerikos Valstijos / United States of America (US)
Language
Anglų / English (en)
Bibliographic Details
2