Ensuring efficiency of electronic devices

Abstract

Electronic devices which that are inspected by using built-in test equipment are considered. The method of ensuring requirements of efficiency index of devices is analyzed. It is shown that the index of efficiency depends on simple index of reliability: mean time between failures and mean time of restoration. The method of ensuring requirements of time between failures provides distribution of serviceability requirements between parts of the device. The opportunities of exception of some failures from the general flow, multifunctional nature of device are taken into account. The method of ensuring requirements of mean time of restoration provides an estimation of separate components of the given index. The expediency of development of complete sets of stocks of components is considered. The question of necessity of specifying stocks of components according to the results of exploitation of devices is analyzed.